| Title | Circuit Lines for Guiding the Generation of Random Test Sequences for Synchronous Sequential Circuits |
| Author | Irith Pomeranz (Purdue Univ., United States), *Sudhakar M. Reddy (Univ. of Iowa, United States) |
| Page | pp. 641 - 646 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |
| Title | A New Low Energy BIST Using A Statistical Code |
| Author | *Sunghoon Chun, Taejin Kim, Sungho Kang (Yonsei Univ., Republic of Korea) |
| Page | pp. 647 - 652 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |
| Title | On Reducing Both Shift and Capture Power for Scan-Based Testing |
| Author | Jia Li (Chinese Academy of Sciences, China), *Qiang Xu (The Chinese Univ. of Hong Kong, Hong Kong), Yu Hu, Xiaowei Li (Chinese Academy of Sciences, China) |
| Page | pp. 653 - 658 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |
| Title | Robust Test Generation for Power Supply Noise Induced Path Delay Faults |
| Author | *Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li (Chinese Academy of Sciences, China) |
| Page | pp. 659 - 662 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |
| Title | Test Vector Chains for Increased Targeted and Untargeted Fault Coverage |
| Author | Irith Pomeranz (Purdue Univ., United States), *Sudhakar M. Reddy (Univ. of Iowa, United States) |
| Page | pp. 663 - 666 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |
| Title | Parallel Fault Backtracing for Calculation of Fault Coverage |
| Author | *Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman (Tallinn Univ. of Tech., Estonia) |
| Page | pp. 667 - 672 |
| Detailed information (abstract, keywords, etc) | |
| PDF file | |