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The 13th Asia and South Pacific Design Automation Conference

Session 6B  Statistical Modeling and Yield Prediction
Time: 15:50 - 17:55 Wednesday, January 23, 2008
Location: Room 310BC
Chairs: Sheldon Tan (Univ. of California, Riverside, United States), Woojin Jin (Samsung Electronics, Republic of Korea)

6B-1 (Time: 15:50 - 16:15)
TitleDetermination of Optimal Polynomial Regression Function to Decompose On-Die Systematic and Random Variations
Author*Takashi Sato, Hiroyuki Ueyama, Noriaki Nakayama, Kazuya Masu (Tokyo Inst. of Tech., Japan)
Pagepp. 518 - 523
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6B-2 (Time: 16:15 - 16:40)
TitleWithin-Die Process Variations: How Accurately Can They Be Statistically Modeled?
AuthorBrendan Hargreaves, Henrik Hult, *Sherief Reda (Brown Univ., United States)
Pagepp. 524 - 530
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6B-3 (Time: 16:40 - 17:05)
TitleChebyshev Affine Arithmetic Based Parametric Yield Prediction Under Limited Descriptions of Uncertainty
AuthorJin Sun, Yue Huang (Univ. of Arizona, United States), Jun Li (Anova Solutions, United States), *Janet M. Wang (Univ. of Arizona, United States)
Pagepp. 531 - 536
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6B-4 (Time: 17:05 - 17:30)
TitleDistribution Arithmetic for Stochastical Analysis
Author*Markus Olbrich, Erich Barke (Univ. of Hannover, Germany)
Pagepp. 537 - 542
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6B-5 (Time: 17:30 - 17:55)
TitleHandling Partial Correlations in Yield Prediction
AuthorSridhar Varadan (Texas A&M Univ., United States), *Janet Wang (Univ. of Arizona, United States), Jiang Hu (Texas A&M Univ., United States)
Pagepp. 543 - 548
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