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The 13th Asia and South Pacific Design Automation Conference

Session 2D  Special Session - Tackling Manufacturability/Variability for 32nm and Below
Time: 13:30 - 15:35 Tuesday, January 22, 2008
Location: Room 311BC
Chair: Dale Edwards (Semiconductor Research, United States)

2D-2
Title(Invited Paper) Predictive Models and CAD Methodology for Pattern Dependent Variability
Author*Nishath Verghese, Richard Rouse, Philippe Hurat (Cadence Design Systems, United States)
Pagepp. 213 - 218
Detailed information (abstract, keywords, etc)
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2D-3
Title(Invited Paper) Technology Modeling and Characterization Beyond the 45nm Node
Author*Sani R. Nassif (IBM, United States)
Pagep. 219
Detailed information (abstract, keywords, etc)
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2D-4
Title(Invited Paper) Synergistic Physical Synthesis for Manufacturability and Variability in 45nm Designs and Beyond
Author*David Z. Pan, Minsik Cho (Univ. of Texas, Austin, United States)
Pagepp. 220 - 225
Detailed information (abstract, keywords, etc)
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